Interferometric material sensing apparatus including adjustable coupling and associated methods

ABSTRACT

A material sensing apparatus comprises an excitation source configured to induce waves in a workpiece, and an optical waveguide interferometer configured to sense the induced waves in the workpiece. The optical wavguide interferometer comprises a probe segment having a probe segment end, and an adjustable coupler configured to permit setting a gap between the probe segment end and the workpiece. A controller is coupled to the adjustable coupler and configured to set the gap between the probe segment end and the workpiece.

GOVERNMENT CONTRACT

This invention was made with Government support under GovernmentContract 03-180 awarded by the FBI. The Government has certain rights inthis invention.

FIELD OF THE INVENTION

The present invention relates to the field of interferometers and, moreparticularly, to optical waveguide interferometers and related methods.

BACKGROUND OF THE INVENTION

Ultrasonic waves may be used to probe a variety of materials,particularly for thickness gauging and flaw detection. The ultrasonicwaves are typically generated with a piezoelectric transducer. Theultrasonic waves propagate through the material, reflecting frominterfaces (in thickness gauging applications) or internal features (inflaw detection applications). The scattered ultrasonic waves propagateback to the surface of the material, causing the surface to vibrate atthe ultrasound frequency. This vibration may be detected with apiezoelectric transducer similar to the one used to generate theultrasonic waves, and then analyzed to generate data about the material.

Optical detection techniques can be used in place of the piezoelectrictransducers to remotely detect the ultrasonic waves. Generally, a laserprobe beam is directed onto the material. When the surface vibrates itimparts a phase shift onto the reflected beam. This phase shift isdetected with a photodetector after mixing the reflected probe beam witha stable reference beam and measuring the amplitude and frequency orphase of the photodetector output intensity fluctuations. The referencebeam originates from the same laser source as the reflected probe beam,and the output signal from the photodetector corresponds to the surfacemotion.

One problem with laser detection systems is low sensitivity. Typically,the material surface that is being probed has a diffusely reflecting orscattering quality. Consequently, the reflected beam is highly aberratedand its wavefront is mismatched with respect to the reference beam. Theresulting signal produced by the photodetector is therefore weak andlacks precision.

In U.S. Pat. No. 6,075,603 to O'Meara, a contactless system for imagingan acoustic source within a workpiece is disclosed. In this system, anarray of discrete optical detectors is arranged in a pattern. A probebeam is directed onto a vibrating surface in a pattern that correspondsto the detector array. The probe beam is reflected onto the detectorarray and a reference beam is also directed onto the detector array atan angle to the probe beam to produce fringe patterns on the detectorsthat correspond to the surface vibration pattern. A readout systemutilizes the discrete detector outputs to produce an array output signalindicative of at least a size and two dimensional location for theacoustic source relative to the vibrating surface. This system, however,may not provide the desired accuracy, and may be sensitive tofluctuations in the length of the paths between the probe beam and thesurface, and the reference beam and the surface.

U.S. Pat. No. 7,262,861 to Pepper discloses a laser ultrasonicinspection apparatus which enables remote sensing of thickness,hardness, temperature and/or internal defect detection. A lasergenerator impinges on a workpiece with light for generating athermo-elastic acoustic reaction in a workpiece. A probe laser impingeson the workpiece with an annularly-shaped probe light for interactionwith the acoustic signal in the workpiece resulting in a modulatedreturn beam. A photodetector having a sensitive region is used fordetecting an annularly-shaped fringe pattern generated by an interactionof a reference signal with the modulated return beam at the sensitiveregion.

This system, however, may not provide the desired accuracy, and may besensitive to fluctuations in the length of the path between the probebeam and the surface, or fluctuations in the path lengths of thereference and measurement arms of the interferometer.

SUMMARY OF THE INVENTION

In view of the foregoing background, it is therefore an object of thepresent invention to provide a biological material sensing apparatus.This and other objects, features, and advantages in accordance with thepresent invention are provided by a biological material sensingapparatus permitting adjustment of a gap between an interferometer probeand a workpiece that includes an excitation source configured to inducewaves in a workpiece, and an optical waveguide interferometer configuredto sense the induced waves in the workpiece. The optical waveguideinterferometer comprises a probe segment having a probe segment end, andan adjustable coupler configured to permit setting a gap between theprobe segment end and the workpiece. A controller is coupled to theadjustable coupler and configured to set the gap between the probesegment and the workpiece.

The optical waveguide interferometer may also include a laser source,and a photodetector coupled to the controller. An optical coupleroperatively connects the laser source, the photodetector, and the probesegment. The controller is further configured to generate workpiece databased upon the sensed induced waves.

Setting the gap between the probe segment and the workpieceadvantageously allows the optical waveguide interferometer to be tunedsuch that the distance between the probe segment end and the workpieceis a desired fraction or multiple of the wavelength of light emittedfrom the probe segment end. This helps to minimize distortions in thegenerated workpiece data.

In some applications, the adjustable coupler may comprise apiezoelectric body. Alternatively, the adjustable coupler may comprise asleeve surrounding the probe segment end and at least one of a heatingsource and a cooling source associated therewith. In some applications,the heating source may be a laser.

The adjustable coupler comprises a sleeve surrounding the probe segmentend. In addition, the adjustable coupler may further comprise a biasingmember configured to urge the sleeve in contact with the workpiece. Theprobe end comprises an optical fiber with an angled endface, and theexcitation source may comprise at least one pulsed laser.

A method aspect is directed to a method of sensing a workpiececomprising inducing waves in the workpiece using an excitation source,and sensing the induced waves in the workpiece using an opticalwaveguide interferometer comprising a probe segment end by at leastsetting a gap between the probe segment end and the workpiece.

According to another aspect, a biological material sensing apparatuscomprises an excitation source configured to induce waves in aworkpiece, and an optical waveguide interferometer configured to sensethe induced waves in the workpiece. The optical waveguide interferometercomprises a laser source, and a probe segment having a probe segment endto be positioned adjacent the workpiece and defining a gap therebetween.An optical coupler is operatively connecting the laser source and theprobe segment. In addition, a controller is coupled to the laser sourceand configured to adjust the wavelength of the laser source so that adesired multiple of the wavelength equals the gap between the probesegment end and the workpiece.

According to a further aspect, a biological material sensing apparatusincludes an excitation source configured to induce waves in a workpiece,and an optical waveguide interferometer configured to sense the inducedwaves in the workpiece. The optical waveguide interferometer comprises alaser source, and a probe segment having a probe segment end to bepositioned adjacent the workpiece and defining a gap therebetween. Anoptical coupler operatively connects the laser source and the probesegment, and a controller is coupled to the laser source and configuredto adjust the wavelength of the laser source so that a desired multipleof the wavelength equals the gap between the probe segment end and theworkpiece.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic block diagram of a sensing apparatus, according tothe present invention.

FIG. 2 is a schematic sectional view of an adjustable coupler, as usedwith the sensing apparatus of FIG. 1.

FIG. 3 is a schematic sectional view of another adjustable coupler, suchas may be used with the sensing apparatus of FIG. 1.

FIG. 4 is a schematic sectional view of yet another adjustable coupler,such as may be used with the sensing apparatus of FIG. 1.

FIG. 5 is a schematic cross sectional view of an additional adjustablecoupler, such as may be used with the sensing, apparatus of FIG. 1.

FIG. 6 is a schematic block diagram of another embodiment of a sensingapparatus, according to the present invention.

FIG. 7 is a flowchart of a method of sensing a target in accordance withthe present invention.

FIG. 8 is a partial schematic sectional view of an adjustable coupler ofa biological sensing apparatus sensing an arterial wall in accordancewith the present invention.

FIG. 9 is a partial schematic sectional view of an adjustable coupler ofa material inspection apparatus sensing a weld in accordance with thepresent invention.

FIG. 10 is a schematic block diagram of another sensing apparatus inaccordance with the present invention.

FIG. 11 is a schematic block diagram of yet another sensing apparatus inaccordance with the present invention.

FIG. 12 is a flowchart of another method of sensing a target inaccordance with the present invention.

FIG. 13 is a partial schematic sectional view of a biological sensingapparatus sensing an arterial wall in accordance with the presentinvention.

FIG. 14 is a partial schematic sectional view of a material inspectionapparatus sensing a weld in accordance with the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

The present invention will now be described more fully hereinafter withreference to the accompanying drawings, in which preferred embodimentsof the invention are shown. This invention may, however, be embodied inmany different forms and should not be construed as limited to theembodiments set forth herein. Rather, these embodiment's are provided sothat this disclosure will be thorough and complete, and will fullyconvey the scope of the invention to those skilled in the art. Likenumbers refer to like elements throughout, and prime notation andmultiple prime are used to indicate similar elements in alternativeembodiments.

Referring initially to FIG. 1, a sensing apparatus 10 in accordance withthe present invention is now described. The sensing apparatus 10 is usedto sense, or determine, a variety of properties of a target 12,including, for example, the dimensions of the target, the materialcomposition of the target, and the thickness of the target.

The sensing apparatus 10 includes an excitation source 14,illustratively a pulsed laser, configured to induce ultrasonic waves inthe target 12. The excitation source 14 is an optical source and isillustratively coupled to the target 12 via an optical fiber 15 havingan end portion 16 in physical contact with the target, although itshould be appreciated that in some embodiments the excitation source isnot coupled to the target via an optical fiber but rather radiates thetarget via free space. The excitation source 14 induces the ultrasonicwaves in the target 12 by rapidly heating it. It should be appreciatedthat in some applications, the excitation source 14 may be a broadbandoptical source, or a doped fiber amplifier.

An optical waveguide interferometer 17 senses the induced waves andgenerates target data based thereupon. In particular, the opticalwaveguide interferometer 17 comprises a probe segment 30 having a probesegment end 31 coupled to the target 12. The interferometer laser source18 is connected to an adjustable coupler 14 via optical fibers 21 andthrough an optical isolator 19 and an optical coupler 22. Also coupledto the optical coupler 22 is a photo-detector 20.

The adjustable coupler 24 is in physical contact with the target 12, andpermits setting a gap between the probe segment end. 31 and the target.A controller 26 is coupled to the adjustable coupler 24 and isconfigured to control the adjustable coupler to thereby set the gapbetween the probe segment end 31 and the target 12.

Operation of the optical waveguide interferometer 17 is now described.The interferometer laser source 18 radiates the target 12 via the probesegment end 31. A portion of the light radiating within the probesegment 30 is reflected back as it hits the probe segment end 31,through the optical coupler 22, and into the photodetector 20.Similarly, a portion of the light radiating within the probe segment 30is radiated from the probe segment end 31 onto the target 12. This lightis then reflected from the target 12 back into the probe segment 30 viathe probe segment end 31, through the optical coupler 22, and into thephotodetector 20. Consequently, the light reflected from the probesegment end 31 and the light reflected from the target 12 will combine,and the superposition thereof is detected by the photodetector 20. Thelight reflected by the target will typically undergo a phase change dueto the ultrasonic waves and resulting vibrations in the target 12, andtherefore will have a different phase than the light reflected by theprobe segment end 31, causing constructive and destructive interferenceto occur therebetween. This interference therefore reflects a detectionof the sensed induced waves and can be analyzed in order to determinevarious properties of the target, as will be appreciated by thoseskilled in the art.

The controller 26 generates target data based upon the sensed inducedwaves. To do so, a laser pulse from the pulsed laser 14 triggers thestart of a measurement cycle, performed by the controller 26, in thetime domain. Signal peaks observed by the controller 26 correspond tothe transit time of surface waves from the point of excitation (that is,the point of the target 12 on which the pulse from the pulsed laser 14radiates) to the probe segment end 31. Since the distance between theexcitation point and the probe segment end 31 is known, the acousticvelocity of the ultrasonic waves in the target 12 can be calculated. Bycomparing this acoustic velocity to a table of acoustic velocity fordifferent materials, the material composition of the target can bedetermined. It should be understood that the adjustable coupler 24 andexcitation source probe 16 can be scanned to different locations on thetarget 12, so as to gather information about many points of the target.

The controller 26 may include a processor and a memory cooperatingtherewith. The memory may be volatile or non-volatile, and the processormay be an integrated circuit, in some applications.

In addition, the controller 26 performs typical interferometriccalculations as known to those of skill in the art on the superpositionof the light reflected by the probe segment end 31 and the lightreflected by the target 12 to potentially determine the dimensionsand/or the thickness of the target. Since a difference in the length ofthe path traveled by the light reflected by the probe segment end 31′and the light reflected by the target 12 will result in an additionalphase difference therebetween, it is desirable for the difference in thelength of that path to remain the same. That is, it desirable for thegap between the probe segment end 31 and the target 12 to remainconstant, such that the gap is a desired multiple of the wavelength ofthe light radiated by, and reflected into, the probe segment end 31′.The multiple used need not be an integer in some embodiments, and neednot be greater than one in some embodiments.

As stated above, the controller 26 controls the adjustable coupler 24 toadjust the gap. As shown in FIG. 2, the adjustable coupler 24, in someembodiments, may comprise a sleeve 29 surrounding probe segment end 31,and a biasing member 28 to urge the sleeve 29 in physical contact withthe target 12. The biasing member 28 comprises a cylinder configured toreceive the sleeve 29, and a spring arranged so as to urge the sleeve incontact with the target 12. A ferrule 35 slidably holds the probesegment end 31 inside the sleeve 29. The purpose of the biasing member28 urging the sleeve 19 in contact with the target 12 is to helpcoarsely adjust the gap between the probe segment end 31 and the target12 even though the target may be vibrating.

Thermal drifting, however, may cause the sleeve 19, the probe 30, andthe probe segment end 31 to expand and contract at different rates,which leads to the gap changing. Since this is not desirable, theadjustable coupler 24 may include additional components to fine tune thegap.

For example, as shown in FIG. 3, the adjustable coupler 24′ may includea piezoelectric sleeve 32′ surrounding the probe segment end 32′, whichis in turn surrounded by the sleeve 29′. The controller 26′ applies avoltage to the piezoelectric sleeve 32′, causing the piezoelectricsleeve to expand or contract, thereby altering the length of the probesegment end 31′. This therefore allows fine tuning of the gap betweenthe probe segment end 31′ and the target 12′. The controller 26′ may becoupled to the piezoelectric sleeve 32′ via any suitable method, such assuitable electrical contacts between the sleeve 19′ and thepiezoelectric sleeve 32′.

Another embodiment of the adjustable coupler 24 is shown in FIG. 4, andincludes a temperature control unit 33″ surrounding the sleeve 19″. Thetemperature control unit 33″ is illustratively a Peltier effect unit,and is controlled by the controller 26″. The controller 26″ uses thePeltier effect unit 24″ to heat or cool the sleeve 19″ and probe segmentend 31″ to thereby cause the sleeve 19″ and probe segment end 31″ toexpand or contract, which in turn allows fine tuning of the gap betweenthe probe segment end and the target 12″.

A further embodiment of the adjustable coupler 24 is shown in FIG. 5,and includes a laser heating source 34″′ configured to radiate thesleeve 19″′, and thereby heat the sleeve 19″′ and probe segment end 31″′to cause the sleeve and probe segment end to expand or contract, whichin turn allows fine tuning of the gap between the probe segment end andthe target 12″′.

Referring once again to FIG. 1, in the above examples, it should beunderstood the controller 26 controls the adjustable coupler 24 basedupon an error signal. This error signal may be the DC component of thelight detected by the photodetector 20, for example.

A further embodiment of the sensing apparatus 110 is shown in FIG. 6.Here, there is no mechanically adjustable coupler, although theexcitation source 114, optical isolator 119, optical coupler 122,photodetector 120, probe segment 130, probe segment end 131, and opticalfibers 115, 121 are similar to those described above with reference toFIG. 1. Rather than adjusting the gap between the probe segment end 131and the target 112 such that the gap is a desired multiple of thewavelength of the light radiated by, and reflected into, the probesegment end, the wavelength of the interferometer laser source 118 isadjusted by the controller 126 such that a desired multiple of thewavelength equals the gap.

It should be understood that the sensing apparatuses 10, 10′, 10″, 10″′,100 disclosed above may include an array of excitation sources 14, 14′,14″, 14″′, 114, and an array of optical waveguide interferometers as,18′, 18″, 18″′, 118.

With additional reference to the flowchart 40 of FIG. 7, a method ofsensing a target is now described. After the start (Block 41), waves areinduced in a target by an excitation source (Block 42). Next, theinduced waves are sensed by an optical waveguide interferometer (Block43). The optical waveguide interferometer comprises a probe segmenthaving a probe segment end, an adjustable coupler configured to permitsetting a gap between the probe segment end and the target.

Next, the method includes setting the gap between the probe segment endand the target using a controller coupled to the adjustable coupler(Block 44). Then, target data is generated based upon the sensed induceswaves, using the controller (Block 45). Block 46 indicates the end ofthe method.

It should be understood that the sensing apparatuses 10, 10′, 100disclosed above offer numerous advantages. For example, the use of apulsed laser 14, 14′, 114 as an excitation source allows a widebandwidth of ultrasonic waves to be induced in the target 12, 12′, 112as opposed to conventional piezoelectric excitation sources whichtypically produce more narrow bandwidths. For example, the pulsed laser14, 14′, 114 can produce ultrasonic waves with a bandwidth above 1 MHz,which is difficult to achieve with conventional piezoelectric excitationsources. In addition, with a piezoelectric excitation source, a physicalmatching layer of often required to achieve a proper acoustic impedancematch between the excitation source and the target. The sensingapparatuses 10, 10′, 100 disclosed above do not suffer this drawback andare adaptable to a wide range of target materials by adjusting theinterferometer spacing either through tuning of the interferometer laser18, 18′, 118 wavelength, or tuning of the adjustable coupler 24, 24′,124′, as opposed to using a variety of matching layers.

In addition, the ability of the sensing apparatuses 10, 10′, 10″, 10″′to either adjust the gap between the probe segment end 31, 31′, 31″,31″′ and the target 12, 12′, 12″, 12″′ or the wavelength of theinterferometer laser source 118, on the fly and based upon a feedbackerror signal provides for precise results, as effects that negativelyimpact the results can be adjusted for and mitigated. Furthermore, theuse of a pulsed laser 14, 14′, 14″, 14″′, 114 as the excitation source,coupled with the use of the optical waveguide interferometer 17, 17′,17″, 17″′, 117 allows the sensing apparatus 10, 10′, 10″, 10″′, 110 tobe compact and portable. Moreover, the use of optical fibers to couplethe pulsed laser 14, 14′, 14″, 14″′, 114 and interferometer laser source18, 18′, 18″, 18″′, 118 to the target 12, 12′, 12″, 12″′, 112 allows thesensing of hard to reach targets, since the optical fibers may beinserted into small spaces.

The sensing apparatuses 10, 10′, 10″, 10″′, 110 disclosed herein areuseful in a wide variety of applications. For example, they may beuseful in medical imaging systems, for sensing and imaging body parts.For example, the optical fibers of the pulsed laser 14, 14′, 14″, 14″′,114 and interferometer laser source 18, 18′, 18″, 18″′, 118 may beinserted into arteries, in order to image those arteries or measure thethickness thereof, or may be inserted into a trachea in order to imagevarious components of the digestive system of a patient. Shown in FIG. 8is an embodiment where the sensing apparatus 200 (similar to the sensingapparatuses disclosed above) is a biological sensing device, and thetarget 212 is an artery having an arterial wall 250. Here, thecontroller will generate anatomical data about the arterial wall 250,such as a thickness or density of the arterial wall. Those skilled inthe art will appreciate that any biological sample or body part may besensed using this sensing apparatus 200.

In addition, the sensing apparatuses 10, 10′, 10″, 10″′, 110 may be usedfor materials inspection. For example, small welds, or welds ininaccessible places, may be inspected using the sensing apparatuses 10,10′, 10″, 10″′, 110. Wire bonds in electronic devices may be inspectedusing the sensing apparatuses 10, 10′, 10″, 10″′, 110. Hydraulic lines,such as those used in avionics systems of aircraft, or brake lines of amotor vehicle, may be inspected using the sensing apparatuses 10, 10′,10″, 10″′, 110. Shown in FIG. 9 is an embodiment where the sensingapparatus 300 (similar to the sensing apparatuses disclosed above) is amaterial inspection device, and the target 312 is a workpiece having aweld 350 to be inspected. Here, the controller will generate materialdata about the material weld 350, such as a thickness, density, orcomposition of the weld 350. Of course, this material inspection device300 need not be limited to weld inspection and may be used to sense orinspect any sort of workpiece.

It should be understood that the specific use examples given above areby no means limiting, and that those of skill in the art will appreciatethat the sensing apparatuses 10, 10′, 10″, 10″′, 110 may be useful in anunlimited number of fields.

Referring to FIG. 10, another embodiment of a sensing apparatus 400 inaccordance with the present invention is now described. The sensingapparatus 400 is used to sense, or determine, a variety of properties ofa target 402, including, for example, the dimensions of the target, thematerial composition of the target, and the thickness of the target.

The sensing apparatus 400 includes an excitation source 404,illustratively a broadband optical source, configured to induceultrasonic waves in the target 402. The excitation source 404 is anoptical source and is illustratively coupled to the target 402 via anoptical fiber 406 having an end portion 408 in physical contact with thetarget, although it should be appreciated that in some embodiments theexcitation source is not coupled to the target via an optical fiber butrather radiates the target via free space. The excitation source 404induces the ultrasonic waves in the target 402 by rapidly heating it. Itshould be appreciated that in some applications, the excitation source404 may be a coherent optical source (e.g. a pulsed laser), or a dopedfiber amplifier. In fact, in some applications, the excitation source404 may be a pulsed laser having a spectral width that is inverselyproportional to the pulse duration.

An optical waveguide interferometer 409 senses the induced waves andgenerates target data based thereupon. In particular, the opticalwaveguide interferometer 409 comprises a plurality of optical couplers416, 414, 422 and interconnecting optical fibers 430 a-430 e, 432 a-432c arranged to define a reference arm (430 a-430 e) and a measurement arm(432 a-432 c). A probe segment 417 is coupled to portions of thereference arm 4300, 430 d and portions of the measurement arm 432 a. Theprobe segment 417 has a probe segment end 418 to be positioned adjacentthe target 402 b. An optical path length adjustor 420 is coupled toportions of the reference arm 430 d, 430 e. The optical path lengthadjustor 420 is illustratively a piezoelectric body, although it shouldbe understood that any suitable optical path length adjustor or fiberstretcher may also be used.

A reference light source 410 is coupled to the reference arm 430 a-430 eand is configured to radiate light into the reference arm, and onto thetarget 402 via the probe segment end 418. The reference light source canbe a laser source or doped fiber amplifier, as will be appreciated bythose skilled in the art. For example, the reference light source may bea high gain erbium doped fiber amplifier with a 40 nm bandwidth,centered around a wavelength of 1550 nm.

An optical power detector 412 is coupled to the reference arm 430 a-430e and is configured to receive light from the reference light source 410reflected by the target 402 into the probe segment end 418.

The plurality of optical couplers 416, 414, 422 includes a first opticalcoupler 416 coupling portions of the reference arm 430 c, 430 d toportions of the measurement arm 432 a and the probe segment 417. Asecond optical coupler 414 couples the first optical coupler 416 to thereference light source 410 and optical power detector 412. A thirdoptical coupler 422 couples portions of the reference arm 430 e toportions of the measurement arm 432 a-432 c, which thereby provides adifferential output to the photodetector 424.

A controller 426 is coupled to the optical path length adjustor 420 andis configured to adjust an optical path length of the reference arm 430a-430 e to maintain a constant relationship with respect to an opticalpath length of the measurement arm 432 a-432 c. The controller 426 mayadjust the optical path length of the reference arm 430 a-430 e basedupon the optical power detector 412 and/or the differential outputprovided to the photodetector 424.

Thermal drifting may cause the length of the optical fibers within thereference arm 430 a-430 e and the measurement arm 432 a-432 c to expandand contract at different rates, which leads to the change of theirrespective lengths. This is undesirable because it negatively affectsthe accuracy of the sensing apparatus 400. The controller 426 helpsrectify this undesirable condition by adjusting the path length of thereference arm 430 a-430 e using the optical path length adjustor 420.The matching of the path length of the reference arm 430 a-430 e and themeasurement arm 432 a-432 c by the controller 426 using the optical pathlength adjustor 420 to within 0.0025 in allows particularly accurateresults.

Operation of the optical waveguide interferometer 409 is now described.A portion of the light radiated by the reference light source 410 isradiated from the probe segment end 418 onto the target 402. This lightis then reflected from the target 402 back into the probe segment 417via the probe segment end 418, through the first optical coupler 416,through the second optical coupler 414, and into the optical powerdetector 412. The optical power detector 412 measures the optical powerreflected from the target 402, and due to the arrangement of the opticalcouplers 416, 414, 422, only the optical power reflected from thetarget. That is, the optical couplers 416, 414, 422 are arranged suchthat the light directly emitted by the reference light source 410 doesnot reach the optical power detector 412, and only the light reflectedfrom the target 402 reaches the optical power detector.

A portion of the light radiating from the reference light source 410 isconducted through the reference arm 430 a-430 e by the arrangement ofoptical couplers 416, 414, 422 and to the photodetector. Consequently,the light reflected from the target 402 and a portion of the lightradiated by the reference light source 410 and conducted through thereference arm 430 a-430 e will combine, and the superposition thereof isdetected by the photodetector 424.

The light reflected by the target 402 will typically undergo a phasechange due to the ultrasonic waves and resulting vibrations in thetarget, and therefore will have a different phase than the lightradiated by the reference light source 410 and conducted through thereference arm 430 a-430 e, causing constructive and destructiveinterference to occur therebetween. This interference therefore reflectsa detection of the sensed induced waves and can be analyzed in order todetermine various properties of the target, as will be appreciated bythose skilled in the art.

The controller 426 generates target data based upon the sensed inducedwaves. To do so, a pulse from the excitation source 404 triggers thestart of a measurement cycle, performed by the controller 426, in thetime domain. Signal peaks observed by the controller 426 correspond tothe transmit time of surface waves from the point of excitation (thatis, the point of the target 402 on which the pulse from the excitationsource 404 radiates) to the probe segment end 418. Since the distancebetween the excitation point and the probe segment end 418 is known, theacoustic velocity of the ultrasonic waves in the target 402 can becalculated. By comparing this acoustic velocity to a table of acousticvelocity for different materials, the material composition of the targetcan be determined. It should be understood that the excitation sourceprobe 408 and probe segment end 418 can be scanned to differentlocations on the target 402, so as to gather information about manypoints of the target.

The controller 426 may include a processor and a memory cooperatingtherewith. The memory may be volatile or non-volatile, and the processormay be an integrated circuit, in some applications.

In addition, the controller 426 performs typical interferometriccalculations as known to those of skill in the art on the superpositionof the light radiated from the reference light source 410 and directedthrough the reference arm 430 a-430 e and the light reflected by thetarget 402 to potentially determine the dimensions and/or the thicknessof the target.

Since a difference in the length of the path traveled by the lightreflected by the probe segment end 418 and the light radiated from thereference light source 410 and directed through the reference arm 430a-430 e will result in an additional phase difference therebetween, itis desirable for the length of the reference arm 430 a-430 e and thelength of the measurement arm 432 a-432 c to remain the same, or atleast for a constant relationship between the length of the referencearm and measurement arm to be maintained. If a constant relationshipbetween the length of the reference arm 430 a-430 e and the measurementarm 432 a-432 c is to be maintained, it is desirable for the differencein length to be a desired multiple of the wavelength of the lightradiated by reference light source 410. The multiple used need not be aninteger in some embodiments, and need not be greater than one in someembodiments.

It should be appreciated that the optical path length adjustor 420 neednot operate by physically changing a length of an optical fiber in allembodiments. For example, the optical path length adjustor 420 may be anadjustable delay line or phase modulator which can maintain a constantphase relationship between the light reflected from the target 402 andthe light radiated by the reference light source 410 and through thereference arm 430 a-430 e. The maintenance of a constant phaserelationship between the light in the reference arm 430 a-430 e and themeasurement arm 432 a-432 c also helps to provide accurate results.

In some applications, the reference arm 430 a-430 e may even include afree space element. One such embodiment is now described with referenceto FIG. 11. Here, the sensing apparatus 500 remains the same as thesensing apparatus 400 of FIG. 10, except that the reference arm 530a-530 e includes a free space element. Here, the free space element iscontained within an adjustable lens arrangement 521. The referenceoptical fiber 530 d terminates at a coupler on the first side of theadjustable lens arrangement 521, and radiates reference light via freespace and through a first lens 523. The reference light then passedthrough a second lens 525, which focuses the light back into thereference optical fiber 530 e via another coupler. The distance betweenthe first lens 523 and second lens 525 is adjustable based upon inputreceived from the controller 526. This thereby allows adjustment of thelength of the path of the reference arm 530 a-530 e.

A method of operating a sensing apparatus is now described withreference to the flowchart 550 of FIG. 12. The sensing apparatusincludes an optical waveguide interferometer comprising a plurality ofoptical couplers and interconnecting optical fibers arranged to define areference arm, a measurement arm, a probe segment coupled to thereference arm and the measurement arm and having a probe segment end,and an optical path length adjustor coupled to the reference arm.

After the start of the method (Block 551), the waves are induced in atarget using an excitation source (Block 552). Then, a probe segment endis positioned adjacent the target (Block 553).

An optical path length of the reference arm is then adjusted via theoptical path length adjustor to maintain a constant relationship withrespect to an optical path length of the measurement arm, using acontroller (Block 554). The induced waves are then sensed using aphotodetector coupled to the controller (Block 555). Target data is thengenerated based upon the sensed induced waves, using the controller(Block 556). Block 557 indicates the end of the method.

It should be understood that the sensing apparatuses 400, 500 disclosedabove may include an array of excitation sources 404, 504, and an arrayof optical waveguide interferometers 409, 509.

The sensing apparatuses 400, 500 disclosed herein are useful in a widevariety of applications. For example, they may be useful in medicalimaging systems, for sensing and imaging body parts. For example, theoptical fibers 406, 408, 506, 508 of the excitation source and referencelight source 410, 510 may be inserted into arteries, in order to imagethose arteries or measure the thickness thereof, or may be inserted intoa trachea in order to image various components of the digestive systemof a patient. Shown in FIG. 13 is an embodiment where the sensingapparatus 600 (similar to the sensing apparatuses 400. 500 disclosedabove) is a biological sensing device, and the target is an arteryhaving an arterial wall 650. Here, the controller will generateanatomical data about the arterial wall 650, such as a thickness ordensity of the arterial wall. Those skilled in the art will appreciatethat any biological sample or body part may be sensed using this sensingapparatus 600.

In addition, the sensing apparatuses 400, 500 may be used for materialsinspection. For example, small welds, or welds in inaccessible places,may be inspected using the sensing apparatuses 400, 500. Wire bonds inelectronic devices may be inspected using the sensing apparatuses 400,500. Hydraulic lines, such as those used in avionics systems ofaircraft, or brake lines of a motor vehicle, may be inspected using thesensing apparatuses 400, 500. Shown in FIG. 14 is an embodiment wherethe sensing apparatus 700 (similar to the sensing apparatuses disclosedabove) is a material inspection device, and the target 702 is aworkpiece having a weld 750 to be inspected. Here, the controller willgenerate material data about the material weld 750, such as a thickness,density, or composition of the weld 750. Of course, this materialinspection device 700 need not be limited to weld inspection and may beused to sense or inspect any sort of workpiece.

It should be understood that the specific use examples given above areby no means limiting, and that those of skill in the art will appreciatethat the sensing apparatuses 400, 500, 600, 700 may be useful in anunlimited number of fields.

Other details of such sensing apparatuses 10 may be found in co-pendingapplications INTERFEROMETRIC SENSING APPARATUS INCLUDING ADJUSTABLECOUPLING AND ASSOCIATED METHODS, Attorney Docket No. GCSD-2399 (61749);INTERFEROMETRIC BIOMETRIC SENSING APPARATUS INCLUDING ADJUSTABLECOUPLING AND ASSOCIATED METHODS, Attorney Docket No. GCSD-2400 (61758);INTERFEROMETRIC SENSING APPARATUS INCLUDING ADJUSTABLE REFERENCE ARM ANDASSOCIATED METHODS, Attorney Docket No. GCSD-2355 (61750);INTERFEROMETRIC BIOLOGICAL SENSING APPARATUS INCLUDING ADJUSTABLEREFERENCE ARM AND ASSOCIATED METHODS, Attorney Docket No. GCSD-2401(61760); and INTERFEROMETRIC MATERIAL SENSING APPARATUS INCLUDINGADJUSTABLE REFERENCE ARM AND ASSOCIATED METHODS, Attorney Docket No.GCSD-2402 (61761), the entire disclosures of which are herebyincorporated by reference.

Many modifications and other embodiments of the invention will come tothe mind of one skilled in the art having the benefit of the teachingspresented in the foregoing descriptions and the associated drawings.Therefore, it is understood that the invention is not to be limited tothe specific embodiments disclosed, and that modifications andembodiments are intended to be included within the scope of the appendedclaims.

1. A material sensing apparatus comprising: an excitation sourceconfigured to induce waves in a workpiece; an optical waveguideinterferometer configured to sense the induced waves in the workpieceand comprising a probe segment having a probe segment end, an adjustablecoupler configured to permit setting a gap between the probe segment endand the workpiece, a photodetector, and a controller coupled to saidadjustable coupler and said photodetector, and configured to set the gapbetween the probe segment end and the workpiece, and generate workpiecedata based upon the sensed induced waves.
 2. The material sensingapparatus of claim 1, wherein said controller generates the workpiecedata to represent at least one of a thickness, a composition, and adensity of the workpiece.
 3. The material sensing apparatus of claim 1,wherein said optical waveguide interferometer further comprises: a lasersource; and an optical coupler operatively connecting said laser source,said photodetector, and said probe segment.
 4. The material sensingapparatus of claim 1, wherein said adjustable coupler comprises apiezoelectric body.
 5. The material sensing apparatus of claim 1,wherein said adjustable coupler comprises a sleeve surrounding saidprobe segment end, and at least one of a heating source and a coolingsource associated therewith.
 6. The material sensing apparatus of claim5, wherein said heating source comprises a laser.
 7. The materialsensing apparatus of claim 1, wherein said adjustable coupler comprisesa sleeve surrounding said probe segment end and a biasing memberconfigured to urge said sleeve in contact with the workpiece.
 8. Thematerial sensing apparatus of claim 1, wherein said probe end comprisesan optical fiber with an angled endface.
 9. The material sensingapparatus of claim 1, wherein said excitation source comprises at leastone pulsed laser.
 10. A material sensing apparatus comprising: acoherent excitation source configured to induce waves in a workpiece; anoptical waveguide interferometer configured to sense the induced wavesin the workpiece and comprising a laser source, a probe segment having aprobe segment end, an adjustable coupler configured to permit setting agap between the probe segment end and the workpiece, a controllercoupled to said adjustable coupler and configured to set the gap betweenthe probe segment end and the workpiece, a photodetector coupled to saidcontroller, and an optical coupler operatively connecting said lasersource, said photodetector, and said probe segment; said controller alsoconfigured to generate workpiece data based upon the sensed inducedwaves.
 11. The material sensing apparatus of claim 10, wherein saidcontroller generates the workpiece data to represent at least one of athickness, a composition, and a density of the workpiece.
 12. Thematerial sensing apparatus of claim 10, wherein said adjustable couplercomprises a piezoelectric body.
 13. The material sensing apparatus ofclaim 10, wherein said adjustable coupler comprises a sleeve surroundingsaid probe segment end and at least one of a heating source and acooling source associated therewith.
 14. The material sensing apparatusof claim 13, wherein said heating source comprises a laser.
 15. A methodof sensing a workpiece comprising: inducing waves in the workpiece usingan excitation source; sensing the induced waves in the workpiece, usingan optical waveguide interferometer comprising a photodetector and probesegment having a probe segment end by at least setting a gap between theprobe segment end and the workpiece using an adjustable coupler, andgenerating workpiece data based upon the sensed induced waves, using acontroller coupled to a photodetector.
 16. The method of claim 15,wherein the workpiece data is generated to represent at least one of adensity, a thickness, and a composition of the workpiece.
 17. The methodof claim 15, wherein setting the gap comprises using a controllercoupled to the adjustable coupler to set the gap between the probesegment and the workpiece.
 18. The method of claim 15, wherein theoptical waveguide interferometer further comprises: a laser source; andan optical coupler operatively connecting the laser source, thephotodetector, and the probe segment.
 19. The method of claim 14,wherein the adjustable coupler comprises a piezoelectric body.
 20. Themethod of claim 14, wherein the adjustable coupler comprises a sleevesurrounding the probe segment end and at least one of a heating sourceand a cooling source associated therewith.
 21. The method of claim 19,wherein the heating source comprises a laser.
 22. The method of claim14, wherein the adjustable coupler comprises a sleeve surrounding theprobe segment end and a biasing member configured to urge the sleeve incontact with the workpiece.
 23. A material sensing apparatus comprising:an excitation source configured to induce waves in a workpiece; anoptical waveguide interferometer configured to sense the induced wavesin the workpiece and comprising a laser source, a probe segment having aprobe segment end to be positioned adjacent the workpiece and defining agap therebetween, a photodetector, an optical coupler operativelyconnecting said laser source, said photodetector, and said probesegment, and a controller coupled to said laser source and saidphotodetector, and configured to adjust the wavelength of said lasersource so that a desired multiple of the wavelength equals the gapbetween the probe segment end and the workpiece, and generate workpiecedata based upon the sensed induced waves.
 24. The material sensingapparatus of claim 23, wherein said controller generates the workpiecedata to represent at least one of a density, a thickness, and acomposition of the workpiece.
 25. The material sensing apparatus ofclaim 23, wherein said probe end comprises an optical fiber with anangled endface.
 26. The material sensing apparatus of claim 23, whereinsaid excitation source comprises at least one pulsed laser.
 27. Amaterial sensing apparatus comprising: an excitation source configuredto induce waves in a workpiece; an optical waveguide interferometerconfigured to sense the induced waves in the workpiece and comprising alaser source, a probe segment having a probe segment end comprising anoptical fiber with an angled endface to be positioned adjacent theworkpiece and defining a gap therebetween, a photodetector, an opticalcoupler operatively connecting said laser source, said photodetector,and said probe segment, and a controller coupled to said laser sourceand said photodetector, and configured to adjust the wavelength of saidlaser source so that a desired multiple of the wavelength equals the gapbetween the probe segment end and the workplace, and generate workpiecedata based upon the sensed induced waves.
 28. The material sensingapparatus of claim 27, wherein said controller generates the workpiecedata to represent at least one of a density, a thickness, and acomposition of the workpiece.
 29. The material sensing apparatus ofclaim 27, wherein said excitation source comprises at least one pulsedlaser.
 30. A method of sensing a workpiece using an optical waveguideinterferometer comprising a laser source, a probe segment having a probesegment end to be positioned adjacent the workpiece and defining a gaptherebetween, and an optical coupler operatively connecting said lasersource and said probe segment, the method comprising: inducing waves inthe workpiece using an excitation source; sensing the induced waves inthe workpiece using the optical waveguide interferometer; adjusting thewavelength of said laser source so that a desired multiple of thewavelength equals the gap between the probe segment end and theworkpiece using a controller; and generating workpiece data based uponthe sensed induced waves, using the controller and a photodetectorcoupled thereto.
 31. The method of claim 30, wherein the workpiece datais generated to represent at least one of a density, a composition, anda thickness of the workpiece.
 32. The method of claim 30, wherein theprobe end comprises an optical fiber with an angled endface.
 33. Themethod of claim 30, wherein the excitation source comprises at least onepulsed laser.